"LED lighting products luminous flux decay accelerated test method" has been implemented

May 12, 2017, the National Standards Committee issued the "People's Republic of China National Standard Announcement No. 2017, No. 17", by the semiconductor lighting joint innovation of national key room led the development of national standards GB / T 33720-2017 "LED lighting products luminous flux attenuation Accelerated test method ", will be implemented on December 1, 2017. According to reports, this standard for China's LED lighting business to save a lot of test time, to reduce business development cycle and cost, accelerate the development of LED lighting industry is of great significance.

GB / T 33720-2017 "LED lighting products luminous flux decay accelerated test method" is the State Key Laboratory of semiconductor lighting joint innovation "semiconductor lighting product reliability test and analysis" common research project results transformation, for the rapid and effective evaluation of LED lighting products The luminous flux attenuation feature provides a reasonable and reasonable method to reduce the traditional 6000h test time to less than 2000h without affecting the accuracy of reliability evaluation, and the color stability of LED lighting products, as well as other subsystems Such as power supply drive, thermal structure and secondary optical design to establish a basic reliability requirements, can be widely applied to the market most of the indoor LED lighting, road lighting and special lighting.