The flat panel display ( FPD ) active element feature analysis is similar to the semiconductor integrated circuit testing. However, in order to optimally improve LCD, OLED and LEP testing speed and precision, the need for the existing parameter testing system, mains downlight, connecting cable and test method for appropriate modifications.
No sequence silicon LCD testing should resolve the ultra-low current measurement mains downlight
No sequence silicon ( a-Si ), active matrix liquid crystal diode ( AMLCD ) with traditional techniques, which still dominate the market, such as mobile phones, as well as most of the TV desktop display. Although the a-Si thin film transistor ( TFT ) is a new generation of low temperature silicon polymer ( LTPs ) LCD speed smaller, larger, need more external circuit, led high bay now in its fifth generation and sixth generation products, mains downlight, using the a-Si basal technology to create a larger display, manufacturers are trying to cut costs method of.
Cost is the main consideration, so the testing time must be reduced to the minimum, generally in the product stage need to test parameters are: Id-Vg scan, turn-on voltage of Vth, forward current, mains downlight, leakage current, IL switch ( response time ), contact impedance and capacitance.
These measurements are in LCD flat outer rim surrounding a test element group ( TEGs ) on the. Sometimes, mains downlight, also measured some work pixels to check In-dium / Tin oxide ( ITO ) conductive layer properties.
Typical system includes the confirmation of FPD in the active part properties, including DC source measurement unit ( the source table ), switch matrix ( can use a set of equipment for testing a plurality of devices ), the probe station and a cable connection. Due to the enormous size of flat, mains downlight, FPD product test equipment is quite large, and is highly automated.